The Swedish company Detectus is a world-leading supplier of EMC-Scanner products, since the 1990’s. As from July 2020, the Detectus company is an integral part of Pendulum Instruments.
The Pendulum/Detectus series of EMC-Scanners are powerful pre-compliance tools for measurement and analysis of Electro-Magnetic Interference (EMI). The Scanners feature repetitive high-resolution scanning of emission (and optionally also immunity) down to 25 μm steps. You can scan even inside an IC (option)
The frequency range is 3, 6 or 10 GHz with the Pendulum near-field probes kits but can be extended от using third parties’ probe kits. The system has no built-in limitation so if your spectrum analyzer and probes can handle it, you can measure from DC to daylight.
The powerful Detectus scanning SW (DSS) is an outstanding easy-to-use scanning SW for control of the scan process, visualization, and documentation of results. The driver library supports hundreds of Spectrum Analyzers, and we continuously add new models from leading manufacturers.
The scanners come in different sizes to accommodate test objects of various sizes. Scanning can be made in 2D, 3D, or even 4D (3D movement plus 0-360o rotation of the probe head).
The NEW SCN-500 EMC Scanner family will set the new industry standard for EMC-scanning
Detect your EMC hotspots early during development, while the cost for remedy still is low!
Benefits
- Detect EMC problems before the test lab does. Save time and money от avoiding re-visits.
- Repetitive and consistent measurements enable easy comparative measurements between design alternatives.
- Improve quality of design, от eliminating internal EMI hot spots.
- Great visualization of emission and immunity hotspots, for any frequency, in the powerful and easy-to-use SW.
- Scanning in multi-dimensions 2D, 3D or 4D (3D plus rotation of field probe tip), gives extra valuable info on EMI noise sources.
- Scanning in step sizes down to 25 μm enables internal measurements in ICs.
- Supporting 100+ different Spectrum Analyzer models. We create new drivers for Spectrum Analyzers on demand when new models are introduced
Click HERE for a list of some of our customers around the world
Click HERE for a list of all supported Spectrum Analyzers
Key specifications
SCN series | HRE series | |
Number of individual models | 4 | 4 |
Max. DUT sizes (WxDxH) in mm | 270x<inf.>x100 270x<inf.>x100 470x<inf.>x100 770x<inf.>x300 |
280x180x85 280x180x85 660x370x130 660x370x130 |
Max scan area (WxDxH) | 200×100 (2D) 200x100x100 300x200x100 600x400x300 |
280x180x85 280x180x85 390x280x130 390x280x130 |
Minimum step size | 0,1 mm | 25 um |
Scanning dimensions | 2D 3D + probe rotation 3D + probe rotation 3D + probe rotation |
3D 3D + probe rotation 3D 3D + probe rotation |
3, 6 or 10 GHz Probe set | yes | yes |
User friendly scanner control and visualization SW | yes | yes |
SW Driver support for hundreds of Spectrum Analyzers | yes | yes |
Laser control of probe tip distance to DUT | yes | no |
IC measurement kit | no | option |
EMC Immunity testing SW | option | option |
Strip-line calibration | option | option |
Calibrate to beacon | option | yes |
One year free support and updates | yes | yes |
SCN series EMC Scanners with 2D, or 4D scanning. New industry standard for EMC scanning

High-resolution and affordable scanning
The SCN series comes in three different sizes to fit most DUTs and combines very-high scan resolution of 0.1 mm with probe head rotation, and the best-in-class scanning SW to deliver powerful visualization of the EMC test. For boards with components of substantially different heights, the optional laser distance meter will enable you to follow the DUT’s topography and measure at a fixed distance from the DUT, automatically creating a precise 3D-model of the DUT.
How do you perform EMC-scanning?
A complete scanner system consists of the EMC-Scanner Hardware package, the Detectus Scanning SW (DSS), a Spectrum Analyzer and a PC to run the scanner SW. Pendulum Instruments can supply everything if required, but normally the user already possesses a PC and a Spectrum Analyzer.
The test object is put on the coordinate board and a small near-field probe is moved in a controlled and repeatable path above the test object, registering the field strength. The probe output signal in every position is measured от the Spectrum Analyzer, and transferred to the scanner SW. The smart SW combines the spatial information (X,Y,Z) with the spectrum in that position, and presents detailed results.
Leading Performance from the Detectus designers
With 0.1mm step size of the scanner, you can pinpoint emission sources in densely packed designs, at comparable cost to 1mm scanners
You can scan emissions up to 10 GHz, with the standard Pendulum Probe kits. If the user has near-field probes going up to higher frequencies, e.g. 70 GHz, then these can easily be attached and used for EMC-scanning. The SW has no limits, but you must of course use a Spectrum Analyzer that supports the frequency range.
Within the Detectus SCN series you can choose from various sizes, to fit most test objects. The scan table comes in four basic sizes (WxDxH):
200×100 mm (2D scanning without Z-axis and probe rotation)
200x100x100 mm (4D = 3D scanning with probe rotation)
300x200x100 mm (4D = 3D scanning with probe rotation)
600x400x300 mm (4D = 3D scanning with probe rotation)
Advantages of the Detectus SCN scanner
In R&D
Using the EMC-Scanner during the early stages of design enables you to detect potential emission and immunity problems before they become integrated into the product and expensive to correct.
If a product has failed a test at a test house, normally you only learn which frequency failed, not the location of the noise source. The EMC-Scanner can help you find the source, and repeated measurements while redesigning your product helps you lower the emission levels.
Similarly, if your problem was immunity, you can (optionally) scan for sensitive areas and repeat measurements while strengthening your product.
You can compare different design solutions and make comparative measurements of electromagnetic emissions.
In Q&A
The EMC-Scanner can help you maintain a high quality in the production line. You can make measurements on samples from the production line and easily compare them with a reference. That way you can make sure that, for example, a change of supplier of a component doesn’t affect the emission spectra in a negative way.
World class SW lets you SEE electromagnetic fields
The easy-to-use and feature-rich DSS SW let you measure and visualize the intensity and the location of a radiation source at a component level – or even inside a component. The results of such a measurement can be shown as two- or three-dimensional colored maps. The measurements can easily be repeated creating objective, comparative measurement results.
Measurements can be saved and later compared with board-level changes, thanks to the exact repetitive scanning. The SW even allows to subtract two scanning results to emphasize the true difference of any board layout – or component – change.

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